The Advanced Algorithm for Band Mura Analysis and Quantification in LCD Panels

被引：0
|
作者：
Chen, Chien-Wen [1 ]
Hsu, Ming-Chun [1 ]
Fang, Yen-Wen [1 ]
Kuo, Chia-Chia [1 ]
Wang, Ko-Shun [1 ]
机构：
[1] AU Optron Technol Ctr, Measurement Technol Dept, Hsinchu 30078, Taiwan
来源：
2009 SID INTERNATIONAL SYMPOSIUM DIGEST OF TECHNICAL PAPERS, VOL XL, BOOKS I - III | 2009年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
To inspect band mura of LCD panels, it is realized to replace human eyes by CCD measurement system with an advanced algorithm. The analyzed results not only qualitatively describe band Raw data mura but also are used to define quantification factors which have good agreement with judged values of several inspectors.
引用
收藏
页码：706 / 708
页数：3
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