2D test sequence generators

被引：1
|
作者：
Mrugalski, G
Tyszer, J
Rajski, J
机构：
[1] Poznan Univ Technol, Inst Elect & Telecommun, PL-60965 Poznan, Poland
[2] Mentor Graph Corp, Wilsonville, OR 97070 USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2003年 / 20卷 / 01期
关键词：
D O I：
10.1109/MDT.2003.1173053
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In experiments examining test pattern generators using LFSRs with and without phase shifters as sources of 2D stimuli, generators with phase shifters consistently achieved higher hit ratios than those without them. Moreover, a new algorithm synthesizes phase shifters, minimizes linear dependencies, and highly balances the use of generator stages.
引用
收藏
页码：51 / 59
页数：9
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