Deep-learning-based deflectometry for freeform surface measurement

被引:11
|
作者
Dou, Jinchao [1 ]
Wang, Daodang [1 ]
Yu, Qiuye [1 ]
Kong, Ming [1 ]
Liu, Lu [1 ]
Xu, Xinke [1 ]
Liang, Rongguang [2 ]
机构
[1] China Jiliang Univ, Coll Metrol & Measurement Engn, Hangzhou 310018, Peoples R China
[2] Univ Arizona, James C Wyant Coll Opt Sci, Tucson, AZ 85721 USA
基金
中国国家自然科学基金;
关键词
WAVE-FRONT; REFLECTIVE SURFACE; DESIGN;
D O I
10.1364/OL.447006
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We propose a deep-learning based deflectometric method for freeform surface measurement, in which a deep neural network is devised for freeform surface reconstruction. Full-scale skip connections are adopted in the network architecture to extract and incorporate multi-scale feature maps from different layers, enabling the accuracy and robustness of the testing system to be greatly enhanced. The feasibility of the proposed method is numerically and experimentally validated, and its excellent performance in terms of accuracy and robustness is also demonstrated. The proposed method provides a feasible way to achieve the general measurement of freeform surfaces while minimizing the measurement errors due to noise and system geometry calibration. (C) 2021 Optica Publishing Group
引用
收藏
页码:78 / 81
页数:4
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