Towards Model-Based Test Automation for Embedded Systems Using UML and UTP

Model-based methodologies such as the Model-Driven Development (MDD) and Model-Based Testing (MBT) are being explored, in the recent decade, for automation in embedded software engineering projects. In this context, the target of this paper is to demonstrate the adoption and applicability of the Unified Modeling Language (UML) and the UML Testing Profile (UTP) for deploying MBT in Resource-Constrained (RC)-Real-Time Embedded Systems (RTES). Though the UTP standard has been introduced several years ago, concrete approaches or tool support for generating the test artifacts based on the UTP is currently unavailable. This paper aims to close this gap and discusses a concise set of UTP artifacts in the context of MBT for RC-RTES. A detailed discussion on the test artifacts generation algorithm demonstrating the applicability of our approach in a real-life RC-RTES example is presented.