共 50 条
- [4] Line Profile Analysis in the Rietveld method and Whole-Powder-Pattern Fitting [J]. EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2001, 378-3 : 132 - 141
- [6] QUANTITATIVE PHASE-ANALYSIS USING THE WHOLE X-RAY-POWDER DIFFRACTION PATTERN [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 : C364 - C364
- [7] Quantitative phase analysis by combining the Rietveld and the whole-pattern decomposition methods [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2002, 35 : 481 - 490
- [8] QUANTITATIVE PHASE ANALYSIS USING THE REFERENCE INTENSITIES OR THE WHOLE XRD PATTERN. [J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 103 - 103
- [10] WHOLE-POWDER-PATTERN FITTING WITHOUT REFERENCE TO A STRUCTURAL MODEL - APPLICATION TO X-RAY-POWDER DIFFRACTOMETER DATA [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 440 - 447