Low-cost software-based self-testing of RISC processor cores

被引:9
|
作者
Kranitis, N [1 ]
Xenoulis, G
Gizopoulos, D
Paschalis, A
Zorian, Y
机构
[1] Univ Athens, Dept Informat & Telecommun, GR-15771 Athens, Greece
[2] Univ Piraeus, Dept Informat, Piraeus 46501, Greece
[3] Virage Log, Fremont, CA 94538 USA
来源
关键词
D O I
10.1049/ip-cdt:20030838
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Software self-testing of embedded processor cores, which effectively partitions the testing effort between low-speed external equipment and internal processor resources, has been recently proposed as an alternative to classical hardware built-in self-test techniques over which it provides significant advantages. A low-cost software-based self-testing methodology for processor cores is presented with the aim of producing compact test code sequences developed with a limited engineering effort and achieving a high fault coverage for the processor core. The objective of small test code sequences is directly related to the utilisation of low-speed external testers, since test time is primarily determined by the time required to download the test code to the processor memory at the tester's low frequency. Successful application of the methodology to an RISC processor core architecture with a three-stage pipeline is demonstrated.
引用
收藏
页码:355 / 360
页数:6
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