Fourier Transform Infrared micro spectroscopy mapping applications to the vinyl siding industry

Fourier Transform Infrared (FT-IR) micro spectroscopy is a powerful analytical technique capable of yielding high quality information with a spacial resolution as low as 10 microns. When coupled with an automated mapping stage it can offer unique evaluation capabilities. This paper describes a number of applications of FT-IR micro spectroscopy mapping to the vinyl siding industry. Examples will focus on determining, in single sample mapping experiments, the compositional changes associated with capstock to substrate transition and evaluating the degradation species and level observed during weathering exposure throughout the thickness of the siding panel.