Applications of X-ray intensity interferometry

被引：0
|
作者：
Yabashi, M [1 ]
Tamasaku, K [1 ]
Ishikawa, T [1 ]
机构：
[1] SPring 8 JASRI, Mikazuki, Hyogo 6715198, Japan
来源：
X-RAY MIRRORS, CRYSTALS, AND MULTILAYERS II | 2002年 / 4782卷
关键词：
intensity interferometry; synchrotron radiation; brilliance; coherence; pulsed x-rays;
D O I：
10.1117/12.450979
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Intensity interferometry was applied for characterizing hard synchrotron radiation. Propagation of transverse coherence was evaluated by a couple of coincidence measurements, which have different source-to-image distances. Influences of phase object under several conditions were measured and discussed. X-ray pulse width was determined with high accuracy by scanning bandwidth of monochromator. Application to the next generation synchrotron sources was discussed.
引用
收藏
页码：122 / 131
页数：10
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