Band-Engineered Structural Design of High-Performance Deep-Ultraviolet Light-Emitting Diodes

被引:1
|
作者
Chang, Jih-Yuan [1 ]
Huang, Man-Fang [2 ]
Huang, Chih-Yung [3 ]
Lin, Shih-Chin [3 ]
Wang, Ching-Chiun [3 ]
Kuo, Yen-Kuang [4 ]
机构
[1] Natl Changhua Univ Educ, Ctr Teacher Educ, Changhua 500, Taiwan
[2] Natl Changhua Univ Educ, Inst Photon, Changhua 500, Taiwan
[3] Ind Technol Res Inst ITRI, Mech & Mechatron Syst Res Lab, Hsinchu 310, Taiwan
[4] Natl Changhua Univ Educ, Dept Phys, Changhua 500, Taiwan
来源
CRYSTALS | 2021年 / 11卷 / 03期
关键词
AlGaN; carrier confinement; polarization effect; light-emitting diodes;
D O I
10.3390/cryst11030271
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In this study, systematic structural design was investigated numerically to probe into the cross-relating influences of n-AlGaN layer, quantum barrier (QB), and electron-blocking layer (EBL) on the output performance of AlGaN deep-ultraviolet (DUV) light-emitting diodes (LEDs) with various Al compositions in quantum wells. Simulation results show that high-Al-composition QB and high-Al-composition EBL utilized separately are beneficial for the enhancement of carrier confinement, while the wall-plug efficiency (WPE) degrades dramatically if both high-Al-composition QB and EBL are existing in a DUV LED structure simultaneously. DUV LEDs may be of great optical performance with appropriate structural design by fine-tuning the material parameters in n-AlGaN layer, QB, and EBL. The design curves provided in this paper can be very useful for the researchers in developing the DUV LEDs with a peak emission wavelength ranging from 255 nm to 285 nm.
引用
收藏
页码:1 / 14
页数:14
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