Short-Circuit Behavior of series-connected High-Voltage IGBTs

被引:0
|
作者
Fuhrmann, Jan [1 ]
Eckel, Hans-Guenter [1 ]
Klauke, Sebastian [2 ]
机构
[1] Univ Rostock, Albert Einstein Str 2, Rostock, Germany
[2] Infineon Technol AG, Max Planck Str 5, Warstein, Germany
关键词
IGBT; Diode; Faults; Power semiconductor device; Robustness;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In operation of series-connected IGBTs a voltage balancing is necessary, during short circuits it is even more important. Within this paper the behavior of series-connected IGBTs and diodes during the shortcircuit type 2 and 3 is analyzed. The dv/dt during the short circuit is determined by one of two equivalent circuit capacitances. One is the plasma capacitance and the second one is the Miller capacitance. Depending on the gate-drive unit the dv/dt is intrinsic, when the gate current is sufficiently high, and the plasma capacitance determines the desaturation process during short circuit. Or the gate current controls via the Miller-capacitance feedback the dv/dt. The results are obtained with the help of measurement on 3.3 kV-IGBTs.
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页数:10
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