In situ observations of stress-induced defect formation at the solid-liquid interface

被引:13
|
作者
Fabietti, LM
Trivedi, R
机构
[1] IOWA STATE UNIV SCI & TECHNOL,AMES LAB,US DOE,AMES,IA 50011
[2] IOWA STATE UNIV SCI & TECHNOL,DEPT MAT SCI & ENGN,AMES,IA 50011
[3] UNIV NACL CORDOBA,CONSEJO NACL INVEST CIENT & TECN,FAC MATEMAT ASTRON & FIS,RA-5000 CORDOBA,ARGENTINA
关键词
D O I
10.1016/S0022-0248(96)00840-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Directional solidification experiments have been carried out to examine in situ the stress generated at the interface which lead to the formation of defects. A transparent system, which is also birefringence, is selected for the study to observe simultaneously both the morphology of the interface and the stress fringes. For a cusp orientation, the instability of the interface is shown to give rise to stress generation, and when sufficient stress accumulates, a grain boundary is formed to relieve the stress. A stress-induced parallel grain boundary formation is shown to be the mechanism for planar-to-cellular interface transition. The same mechanism is shown to cause cellular tip splitting to adjust the cellular spacing. A simple model of stress generation due to concentration gradients near the perturbed interface is developed to show the possible mechanism of stress generation.
引用
收藏
页码:503 / 512
页数:10
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