Strain distributions made visible with image-shearing speckle pattern interferometry

被引:66
|
作者
Aebischer, HA
Waldner, S
机构
[1] Swiss Fed. Inst. of Technol., Zurich, Inst. for Des. and Constr. Methods, CH-8092 Zurich
关键词
D O I
10.1016/0143-8166(95)00140-9
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The measurement of in-plane strain with image-shearing speckle pattern interferometry has so far been impeded by the lack of an efficient method for suppressing the our-of-plane displacement derivative. This paper presents a simple optical set-up with three light sources arranged in a particular symmetry and an associated procedure which allows accurate isolation of all six displacement derivatives which can contribute to the formation of fringes in image-shearing speckle pattern interferometry. The method uses a phase-shifting technique and is demonstrated on the deformation of a rectangular tensile specimen with a central hole. The measured in-plane strain components are compared with the results of finite element analysis. High quality fringe patterns are obtained which reveal even localized strain concentrations. The optical set-up proposed in this paper is well suited for applications in an industrial environment, and the associated procedure for isolating the displacement derivatives can easily be automated. Copyright (C) 1996 Elsevier Science Ltd.
引用
收藏
页码:407 / 420
页数:14
相关论文
共 50 条
  • [1] Image-Shearing Speckle Pattern Interferometer with Quadrolens
    Vishnyakov, G. N.
    Minaev, V. L.
    Ivanov, A. D.
    Vinogradov, F. Yu.
    [J]. OPTICS AND SPECTROSCOPY, 2020, 128 (10) : 1701 - 1705
  • [2] Image-Shearing Speckle Pattern Interferometer with Quadrolens
    G. N. Vishnyakov
    V. L. Minaev
    A. D. Ivanov
    F. Yu. Vinogradov
    [J]. Optics and Spectroscopy, 2020, 128 : 1701 - 1705
  • [3] Quantitative strain analysis with image shearing speckle pattern interferometry
    Waldner, S
    Goudemand, N
    [J]. INTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONS, 2000, : 319 - 326
  • [4] Spatial phase-shifting technique in large image-shearing electronic speckle pattern interferometry
    Sun, Ping
    [J]. OPTICAL ENGINEERING, 2007, 46 (02)
  • [5] IMAGE-SHEARING SPECKLE-PATTERN INTERFEROMETER FOR MEASURING BENDING MOMENTS
    LEENDERT.JA
    BUTTERS, JN
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (11): : 1107 - 1110
  • [6] GPU accelerated image processing for electronic speckle pattern shearing interferometry
    Shao Heng
    Zhou Yong
    Qi Jun-feng
    Nie Zhong-yuan
    [J]. CHINESE JOURNAL OF LIQUID CRYSTALS AND DISPLAYS, 2019, 34 (10) : 1021 - 1029
  • [7] Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry
    Benito Pascual-Francisco, Juan
    Susarrey-Huerta, Orlando
    Michtchenko, Alexandre
    Barragan-Perez, Omar
    [J]. DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS VII, 2018, 10667
  • [8] Temporal heterodyne shearing speckle pattern interferometry
    Wang, Xu
    Gao, Zhan
    Qin, Jie
    Zhang, Xiaoqiong
    Yang, Shanwei
    [J]. OPTICS AND LASERS IN ENGINEERING, 2017, 93 : 76 - 82
  • [9] Dynamical digital speckle pattern shearing interferometry
    Henao, R
    Rabal, H
    Torroba, R
    [J]. OPTIK, 1997, 105 (01): : 13 - 15
  • [10] DIGITAL SPECKLE-PATTERN SHEARING INTERFEROMETRY
    NAKADATE, S
    YATAGAI, T
    SAITO, H
    [J]. APPLIED OPTICS, 1980, 19 (24): : 4241 - 4246