Power semiconductor laser diode arrays characterization

Nowadays, power semiconductor laser diode arrays are becoming a widespread source for a large variety of industrial applications. In particular, the availability of low-cost high-power laser diode arrays makes their use possible in the industrial context for material cutting, welding, diagnostics and processing. In the above applications, the exact control of the beam quality plays a very important role because it directly affects the reliability of the final result. In this paper, we present two different approaches useful for the characterization of the beam quality in laser diode arrays. The first one, starting from total intensity measurements on planes orthogonal to the beam propagation path, is able to deduce the working conditions of each laser setting up the array. The second one is aimed at the measurement of a global quality factor of the array itself, to this end, the empirical extension of the M-2 concept to composite beams is presented along with some experimental results. As the first technique is especially intended for the non-destructive detection of design problems in the array itself and in the bias circuitry, the second one represents a powerful tool for the rapid on-line diagnostics of the laser beam during its use. (C) 2002 Elsevier Science Ltd. All rights reserved.