Generalized form characterization of ultra-precision freeform surfaces

被引:15
|
作者
Cheung, Chi Fai [1 ]
Kong, LingBao [1 ]
Ren, Mingjun [1 ]
Whitehouse, David [2 ]
To, Suet [1 ]
机构
[1] Hong Kong Polytech Univ, Dept Ind & Syst Engn, Partner State Key Lab Ultraprecis Machining Techn, Kowloon, Hong Kong, Peoples R China
[2] Univ Warwick, Sch Engn, Coventry CV4 7AL, W Midlands, England
关键词
Surface; Measurement; Freeform; METROLOGY;
D O I
10.1016/j.cirp.2012.03.015
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents a generalized form characterization method named intrinsic feature-based pattern analysis method (IFPAM) for measuring ultra-precision freeform surfaces with sub-micrometer form accuracy. The IFPAM makes use of intrinsic surface properties, the Fourier-Mellin transform, and phase correlation to conduct surface registration. A bidirectional curve network based sampling strategy and a robust surface fitting method are built for accurate representation of the measured freeform surfaces. Compared with traditional least-squares-based methods, the IFPAM not only possesses better robustness and higher precision but also less susceptible to the uncertainty due to geometrical complexity and registration problems involving translation and rotation operations. (C) 2012 CIRP.
引用
收藏
页码:527 / 530
页数:4
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