Scalable Fault Coverage Estimation of Sequential Circuits without Fault Injection

被引：0
|
作者：
Javvaji, Pavan Kumar [1 ]
Tragoudas, Spyros [1 ]
Kondapuram, Ganesh [2 ]
机构：
[1] Southern Illinois Univ, Dept Elect & Comp Engn, Carbondale, IL 62901 USA
[2] Intel Corp, Santa Clara, CA 95051 USA
来源：
2018 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2018年
关键词：
Functional Safety; Fault Coverage; Regression; IEC; 61508; ISO; 26262;
D O I：
10.1109/ISCAS.2018.8351284
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Industrial and automotive standards for safety critical System on Chips require fault coverage at the gate level. A scalable estimation method that avoids fault injection is presented. It is statistically correlated to the actual fault coverage.
引用
收藏
页数：5
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