Possibility of measuring exchange force through force microscopy

被引：6

作者：

Nakamura, K ^{[1
]}

Oguchi, T

Hasegawa, H

Sueoka, K

Hayakawa, K

Mukasa, K

机构：

[1] Hokkaido Univ, Ctr Catalysis Res, Sapporo, Hokkaido 0600811, Japan

[2] Hiroshima Univ, ADSM, Dept Quantum Matter, Higashihiroshima 7398526, Japan

[3] Tokyo Gakugei Univ, Dept Phys, Koganei, Tokyo 184, Japan

[4] Hokkaido Univ, Grad Sch Engn, Nanoelect Lab, Sapporo, Hokkaido 0608628, Japan

[5] Japan Sci & Technol Corp JST, CREST, Sapporo, Hokkaido 0608628, Japan

来源：

APPLIED SURFACE SCIENCE | 1999年 / 140卷 / 3-4期

关键词：

exchange force; atomic force microscopy; exchange force microscopy; surface magnetic structure; first-principles calculation;

D O I：

10.1016/S0169-4332(98)00556-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

This article describes the possibility of measuring exchange force through atomic force microscopy (AFM), based on the results of first-principles calculations for the exchange force between two magnetic Fe(001) films. We observed strong variation of the exchange force relative to the surface site. The magnitude of the force variation was larger than the force sensitivity of conventional AFM. These results suggest that a surface magnetic image with atomic resolution can be achieved by measuring the exchange force. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：366 / 370

页数：5

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