Artifacts-free Fourier Ptychographic Microscopy using a misaligned setup

被引:1
|
作者
Bianco, V [1 ]
Mandracchia, B. [1 ,2 ]
Behal, J. [1 ]
Barone, D. [3 ]
Memmolo, P. [1 ]
Ferraro, P. [1 ]
机构
[1] CNR Inst Appl Sci & Intelligent Syst E Caianiello, I-80078 Pozzuoli, NA, Italy
[2] Georgia Inst Technol, North Ave NW, Atlanta, GA 30332 USA
[3] Univ Napoli Federico II, DIETI, I-80138 Naples, Italy
关键词
Fourier Ptychographic Microscopy; Calibration; Image processing; Phase-contrast imaging; Multi-look; ILLUMINATION;
D O I
10.1117/12.2592550
中图分类号
TB3 [工程材料学]; R318.08 [生物材料学];
学科分类号
0805 ; 080501 ; 080502 ;
摘要
Fourier Ptychographic Microscopy (FPM) probes biological samples from multiple directions and provides amplitude and quantitative phase-contrast imaging in label-free modality with large space-bandwidth product. FPM is suitable to analyze tissues in hospitals and analysis labs by unskilled users. However, whenever the FPM setup is misaligned, phase artifacts can prevent a correct retrieval of the sample complex amplitude. Here we show a blind method, named Multi-Look FPM, which eliminates the unwanted artifacts and allows non-expert users skipping the recalibration process. Multi-Look FPM is proved effective in the case of neural tissue slides, cell layers, and marine microalgae with complex inner structures.
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页数:5
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