Use of Langmuir probe in an electron plasma

被引：2
|
作者：
Tsushima, A
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 5A期
关键词：
probe; diagnostics; electron cloud; electron plasma;
D O I：
10.1143/JJAP.35.2820
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Probe measurement in an electron plasma is discussed in terms of a potential distribution near a biased electrode and a probe current. Results ui an experiment are also shown.
引用
收藏
页码：2820 / 2821
页数：2
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