Twin spacing and its correlation with critical current density in melt-textured YBCO with yttria nanoparticle addition

被引:3
|
作者
Jongprateep, O [1 ]
Chan, SW [1 ]
机构
[1] Columbia Univ, New York, NY 10027 USA
关键词
critical current density; nano-particles; twin spacing; YBCO;
D O I
10.1109/TASC.2003.812380
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Twin boundaries have been proved to be effective flux pinning c. enters in YBa2 Cu3O7-x (YBCO). Increases in twin density yield higher values of critical current density. Twin spacings in melt-textured grown (MTG) YBCO with different amounts of yttria nanoparticles were investigated with a new x-ray method, Twin spacings from the x-ray method were compared with those from transmission electron microscopy to show applicability. From investigation, MTG-YBCO with 11.9 weight percent yttria and oxygenation temperature at 680degreesC showed a colony size of 3.65 microns. This particular sample had a small twin spacing of 33 nm with a corresponding high value of critical current density (J(c)) of 1.2 x 10(4) A/cm(2).
引用
收藏
页码:3502 / 3505
页数:4
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