High-T-c SNS edge junctions with integrated YBa2Cu3Ox groundplanes

被引:23
|
作者
Hunt, BD
Forrester, MG
Talvacchio, J
Young, RM
McCambridge, JD
机构
[1] Northrop Grumman Science and Technology Center
关键词
D O I
10.1109/77.621921
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have fabricated high-T-c SNS weak links in an edge geometry with integrated YBa2Cu3Ox (YBCO) groundplanes and SrTiO3 insulators, using a process which incorporates six epitaxial layers, including a Codoped-YBCO normal-metal interlayer. The SNS edge functions were produced using films deposited by both off-axis sputtering and pulsed laser deposition. These devices exhibit tight J(c) spreads and high IcRn products in a current density regime well-suited for SFQ circuit fabrication. we also describe results on SNS junctions fabricated in a novel ''slot'' geometry, designed to reduce junction and interconnect inductances.
引用
收藏
页码:2936 / 2939
页数:4
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