Influence of seed layers on the microstructure of NiFe layers

被引:8
|
作者
Warot, B.
Imrie, J.
Petford-Long, A. K.
Nickel, J. H.
Anthony, T. C.
机构
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
[2] HP Labs, Palo Alto, CA 94304 USA
关键词
transmission electron microscopy; seed layers; NiFe; magnetic properties;
D O I
10.1016/j.jmmm.2003.12.284
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Magnetic tunnel junctions are of interest for their application in magnetic random access memory. Structural parameters can influence the homogeneity of the nanojonctions and we report on the influence of the seed layer on the structural and magnetic properties of a NiFe layer in a (Si/Al2O3/seed layer/NiFe/Al2O3/TaN) multilayer where the seed layers are Ta, TaN and Al2O3. All the NiFe layers are crystalline although the texture, the grain size and the roughness vary with the seed layer. Magnetic measurements indicate small differences in the saturation magnetisation for the films with the different seed layers. (C) 2003 Elsevier B. V. All rights reserved.
引用
收藏
页码:E1495 / E1496
页数:2
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