Conducting probe atomic force microscopy: A characterization tool for molecular electronics

被引：0
|
作者：
Kelley, TW [1 ]
Granstrom, EL [1 ]
Frisbie, CD [1 ]
机构：
[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
来源：
ADVANCED MATERIALS | 1999年 / 11卷 / 03期
关键词：
D O I：
10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO;2-B
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Electrical characterization of materials has undergone significant progress recently, with the development of a number of atomic force microscopy (AFM) techniques. In the report is described a new variant-conducting probe AFM (CPAFM)-which uses conducting probes to measure current-voltage relationships and resistances, and which is reported to be ideal for studying electrical transport on nanometer length scales, in particular for the characterization of organic thin films. Highlights of recent CPAFM measurements on extremely thin crystals of sexithiophene are presented.
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页码：261 / +
页数：5
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