Using colloid lithography to fabricate silicon nanopillar arrays on silicon substrates

被引:19
|
作者
Chen, Jem-Kun [1 ]
Qui, Jia-Qi [1 ]
Fan, Shih-Kang [1 ]
Kuo, Shiao-Wei [1 ]
Ko, Fu-Hsiang [1 ]
Chu, Chih-Wei [1 ]
Chang, Feng-Chih [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Mat Sci & Engn, Taipei 106, Taiwan
关键词
Silicon nanopillar array; Very-large-scale integration; Colloidal lithography; QUANTUM; SURFACES;
D O I
10.1016/j.jcis.2011.10.044
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this study, we partially grafted geminal silanol groups in the protecting organic shells on the surfaces of gold nanoparticles (AuNPs) and then assembled the alkyl-AuNP-Si(OH)(4) particles onto the surfaces of silicon (Si) wafers. The density of assembled AuNPs on the Si surface was adjusted by varying the geminal silanol group content on the AuNP surface: at its optimal content, it approached the high assembly density (0.0254 particles/nm(2)) of an AuNP assembled monolayer. Using reactive-ion etching (RIE) with the templates as masks, we transferred the patterned AuNP assemblies to form large-area, size-tunable, Si nanopillar arrays, the assembly density of which was controlled by the dimensions of the AuNPs. Using this colloidal lithography (CL) process, we could generate Si nanopillars having sub-10-nm diameters and high aspect ratios. The water contact angles of the high-aspect-ratio Si nanopillars approached 150 degrees. We used another fabrication process, involving electron beam lithography and oxygen plasma treatment, to generate hydrophilic 200-nm-resolution line patterns on a Si surface to assemble the AuNPs into 200-nm-resolution dense lines for use as an etching mask. Subsequent CL provided a patterned Si nanopillar array having a feature size of 200 nm on the Si surface. Using this approach, it was possible to pattern sub-10-nm Si nanopillar arrays having densities as high as 0.0232 nm(-2). (C) 2011 Elsevier Inc. All rights reserved.
引用
收藏
页码:40 / 48
页数:9
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