Structural characterization of CdS thin film on quartz formed by femtosecond pulsed laser deposition at high temperature

被引：29
|
作者：
Tong, X. L. [1 ]
Jiang, D. S. [1 ]
Liu, Z. M. [1 ]
Luo, M. Z. [1 ]
Li, Y. [1 ]
Lu, P. X. [2 ]
Yang, G. [2 ]
Long, H. [2 ]
机构：
[1] Wuhan Univ Technol, Minist Educ, Key Lab Fiber Opt Sensing Technol & Informat Proc, Wuhan 430070, Peoples R China
[2] Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China
来源：
THIN SOLID FILMS | 2008年 / 516卷 / 08期
关键词：
cadmium sulfide; femtosecond laser deposition; deposition temperature effect; X-ray diffraction; optical properties;
D O I：
10.1016/j.tsf.2007.06.067
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
US thin films have been grown on quartz substrates using femtosecond pulsed laser deposition. The structural and optical properties of the US thin films were characterized by X-ray diffraction, scanning electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy and Raman spectroscopy. The results indicate that the compositional segregation of the US films could be drawn from the selective evaporation of sulfur from the film surface as a result of heating up the substrates. Growth temperature played an important role on changing crystal structure and optical properties of the US films. (c) 2007 Elsevier B.V All rights reserved.
引用
收藏
页码：2003 / 2008
页数：6
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