All-sapphire-based fiber-optic pressure sensor for high-temperature applications based on wet etching

被引:32
|
作者
Shao, Zhiqiang [1 ,2 ]
Wu, Yalin [2 ]
Wang, Shuang [3 ]
Zhang, Chaozhu [4 ]
Sun, Zhiqiang [2 ]
Yan, Meiyu [3 ]
Shang, Yingqi [2 ]
Song, Erdong [2 ]
Liu, Zhiyuan [2 ]
机构
[1] Harbin Engn Univ, Coll Informat & Commun Engn, Harbin 150001, Peoples R China
[2] China Elect Technol Grp Corp, Res Inst 49, Harbin 150000, Peoples R China
[3] Tianjin Univ, Sch Precis Instrument & Optoelect Engn, Tianjin 300072, Peoples R China
[4] Qilu Univ Technol, Sch Elect & Informat Engn, Jinan 250353, Peoples R China
关键词
D O I
10.1364/OE.417246
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper, we proposed an all-sapphire-based extrinsic Fabry-Perot interferometer (EFPI) pressure sensor based on an optimized wet etching process, aiming to improve the quality of the interference signal. The sapphire pressure sensitive diaphragm (SPSD) was fabricated by wet etching solutions with different mixture ratios of H3PO4 and H2SO4 at 280 degrees C. The differences of mixture ratios affect the surface roughness of SPSD. SPSDs with surface roughness of 3.91nm and 0.39nm are obtained when the mixture ratios of H3PO4 and H2SO4 is 1:1 and 1:3, respectively. We constructed pressure sensing test system adopting these two kinds of SPSD and performed comparative test. The experiment results show that the demodulation jump can be solved and cavity length fluctuation is decreased to +/- 5nm when the surface roughness of SPSD is 0.39nm. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:4139 / 4146
页数:8
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