Pump fluence dependence of ultrafast carrier dynamics in bulk ZnSe

被引：0
|
作者：
Li, Gaofang [1 ]
Chu, Fenghong [1 ]
Hu, Anduo [1 ]
Xue, Liang [1 ]
Bian, Zhenglan [1 ]
Pang, Chengxin [1 ]
Ma, Hong [2 ]
机构：
[1] Shanghai Univ Elect Power, Shanghai 200090, Peoples R China
[2] Shandong Normal Univ, Coll Phys & Elect, Shandong Prov Key Lab Opt & Photon Device, Jinan 250014, Peoples R China
来源：
PROCEEDINGS OF THE FIRST INTERNATIONAL CONFERENCE ON INFORMATION SCIENCE AND ELECTRONIC TECHNOLOGY | 2015年 / 3卷
关键词：
bulk ZnSe; optical-pump terahertz-probe spectroscopy; carrier dynamics; TRANSPORT;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Ultrafast carrier dynamics of bulk ZnSe is investigated by means of the optical-pump terahertz-probe spectroscopy with pump fluence ranging from 38 to 239 mu J/cm(2) at room temperature. With the laser pulse excitation at 400 nm, the negative transmission of terahertz pulse shows an ultrafast rising followed by a biexponential recovery. The relaxation time of fast decay and slow one is increased with pump fluence. This trend is expected for surface states filling, which may inhibit carrier lifetime.
引用
收藏
页码：195 / 197
页数：3
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