Computer-aided X-ray experiment system for domestic diffractometers

The paper is concerned with automation of domestic diffractometers of the DRON, TRS, and TRS-K types using an IBM personal computer. The updating of these diffractometers makes it possible to improve their performance characteristics and to extend their range of application. A special feature of the automated system is that the goniometer axes can be controlled without use of specialized angle sensors. The system can be used to determine the lattice parameters of small-sized single crystals (including specimens exposed to external factors), single-crystal orientation, the texture of polycrystalline specimens, etc.