Phase-field modeling of wetting on structured surfaces

被引:19
|
作者
Luo, KF
Kuittu, MP
Tong, CH
Majaniemi, S
Ala-Nissila, T
机构
[1] Aalto Univ, Phys Lab, FIN-02015 Helsinki, Finland
[2] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada
[3] Brown Univ, Dept Phys, Providence, RI 02912 USA
来源
JOURNAL OF CHEMICAL PHYSICS | 2005年 / 123卷 / 19期
基金
芬兰科学院;
关键词
D O I
10.1063/1.2102907
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We study the dynamics and equilibrium profile shapes of contact lines for wetting in the case of a spatially inhomogeneous solid wall with stripe defects. Using a phase-field model with conserved dynamics, we first numerically determine the contact line behavior in the case of a stripe defect of varying widths. For narrow defects, we find that the maximum distortion of the contact line and the healing length is related to the defect width, while for wide defects, it saturates to constant values. This behavior is in quantitative agreement with the experimental data. In addition, we examine the shape of the contact line between two stripe defects as a function of their separation. Using the phase-field model, we also analytically estimate the contact line configuration and find good qualitative agreement with the numerical results. (c) 2005 American Institute of Physics.
引用
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页数:12
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