The measurement of intensities in the Rotation Electron Diffraction Technique

被引：1

作者：

Buxhuku, M. ^{[1
]}

Hansen, V. ^{[1
]}

Gjonnes, J. ^{[2
]}

机构：

[1] Univ Stavanger, Dept Mech & Struct Engn & Mat Sci, N-4036 Stavanger, Norway

[2] Univ Oslo, Dept Phys, Gaustadalleen 21, N-0371 Oslo, Norway

来源：

MICRON | 2017年 / 101卷

关键词：

Rotation axis; Excitation error; Kikuchi lines; Rotation Electron Diffraction Technique; PRECESSION TECHNIQUE; CRYSTAL-STRUCTURE; TOMOGRAPHY; PHASE;

D O I：

10.1016/j.micron.2017.06.006

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The Rotation Electron Diffraction Technique, recently developed at the University of Stockholm, has been used to acquire three-dimensional electron diffraction data. A mathematical expression to calculate the excitation errors, s(g), is suggested by considering the diffraction geometry and the rotation axis. In order to plot the rocking curves, diffraction patterns taken from CoP3 cubic structure (a = 7.708 angstrom, space group Im (3) over bar) are used as examples. Intensities of some reflections are derived by Multigauge software during the beam tilt series. Rocking curves for two Friedel pair reflections with different angles from the rotation axis are plotted.

引用

页码：103 / 107

页数：5

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