Advanced Functional Safety Mechanisms for Embedded Memories and IPs in Automotive SoCs

被引：0

作者：

Kogan, T. ^{[1
]}

Abotbol, Y. ^{[2
]}

Boschi, G. ^{[3
]}

Harutyunyan, G. ^{[4
]}

Kroul, I. ^{[1
]}

Shaheen, H. ^{[1
]}

Zorian, Y. ^{[4
]}

机构：

[1] Intel Corp, Haifa, Israel

[2] Inomize, Netanya, Israel

[3] Intel Corp, Milan, Italy

[4] Synopsys, Yerevan, Armenia

来源：

2017 IEEE INTERNATIONAL TEST CONFERENCE (ITC) | 2017年

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Given the fast growing complexity and miniaturization of automotive SoCs, this paper presents functional safety challenges and related solutions for such SoCs. The paper is based on ISO 26262 standard and shows experimental results on a SoC example to demonstrate the advantages of the proposed solutions.

引用

页数：6

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