Production of pulsed, mass-selected beams of metal and semiconductor clusters

被引:8
|
作者
Kamalou, Omar [1 ]
Rangama, Jimmy [1 ]
Ramillon, Jean-Marc [1 ]
Guinement, Patrick [1 ]
Huber, Bernd A. [1 ]
机构
[1] UCBN, CNRS, CEA, ENSICaen,CIMAP, F-14070 Caen 05, France
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 06期
关键词
D O I
10.1063/1.2937646
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We report on the development of a beam line for mass-selected metal and semiconductor clusters. The cluster source combines the principles of plasma sputtering and gas condensation. Both techniques together allow to produce clusters in a wide size range. With the aid of a time-of-flight system, small clusters (i.e., Cu-n(+), n < 100) are selected and pure beams containing only one cluster size are provided. For large clusters (containing several thousands of atoms), a beam with a narrow size distribution is obtained. A 90 degrees quadrupole deviator is used to separate charged clusters from neutral ones. (C) 2008 American Institute of Physics.
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页数:5
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