Electroreflectance measurements of electric fields in ordered GaInP2

Ordered Ga0.52In0.48P alloys (GaInP2 for simplicity) grown on miscut [001] GaAs resemble monolayer superlattices with alternating Ga- and In-rich layers along either the [(1) over bar 11] or [1 (1) over bar 1] directions. Recent calculations suggest that, in fully ordered GaInP2, an intrinsic ordering-induced electric field of order 1600 kV/cm should exist. In partially ordered samples, as can actually be grown, the expected field is reduced to 400 kV/cm. For such a strong internal electric field, clear Franz-Keldysh Oscillations (FKOs) would be expected in an electroreflectance measurement. We report electroreflectance measurements of ordered GaInP2 layers measured at T=100 K. For all samples measured, no FKOs are observed in the absence of an additional external dc bias voltage. At the lowest bias voltages for which FKOs are seen, the internal electric field in the GaInP2 layer, determined from the FKOs, is similar to 60 kV/cm along the [001] direction corresponding to similar to 100 kV/cm along the ordering direction. Hence, we conclude that, at least in the organometallic vapor phase epitaxy grown samples studied here, any net macroscopic internal electric field in the GaInP2 layer is less than similar to 100 kV/cm along the ordering direction. (C) 1998 American Institute of Physics. [S0021-8979(98)02418-9].