D2NN A Fine-Grained Dual Modular Redundancy Framework for Deep Neural Networks

被引:12
|
作者
Li, Yu [1 ]
Liu, Yannan [2 ]
Li, Min [1 ]
Tian, Ye [1 ]
Luo, Bo [1 ]
Xu, Qiang [1 ]
机构
[1] Chinese Univ Hong Kong, Dept Comp Sci & Engn, CUhk REliable Comp Lab CURE, Shatin, Hong Kong, Peoples R China
[2] Sangfor Technol Inc, Shenzhen, Peoples R China
基金
中国国家自然科学基金;
关键词
DNN; dual modular redundancy; fault injection attack; security;
D O I
10.1145/3359789.3359831
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Deep Neural Networks (DNNs) have attracted mainstream adoption in various application domains. Their reliability and security are therefore serious concerns in those safety-critical applications such as surveillance and medical systems. In this paper, we propose a novel dual modular redundancy framework for DNNs, namely D2NN, which is able to tradeoff the system robustness with overhead in a fine-grained manner. We evaluate D2NN framework with DNN models trained on MNIST and CIFAR10 datasets under fault injection attacks, and experimental results demonstrate the efficacy of our proposed solution.
引用
收藏
页码:138 / 147
页数:10
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