Certain features of high-dose and intensive implantation of aluminium ions in iron

Using a proton microbeam proton-induced X-ray emission (PIXE) and RES, a formation of local surface segregations of Al in an Fe layer, has been found for the first time at an initial stage of high-dose intensive implantation (from 8 x 10(16) to 2 x 10(17) cm(-2) dose irradiation). Using a slow positron beam, a profile of vacancy defects, whose depth is comparable with a depth profile of Al ions implanted into Fe with 5 x 10(17) cm(-2) dose implantation, has been measured. The revealed regions with a local surface segregation of Al turned out to be partiality amorphized after 2 x 10(17) cm(-2) dose irradiation, according to conversion electron Mossbauer spectra (CEMS) measurements. (C) 1998 Published by Elsevier Science S.A. All rights reserved.