Measurement of Off-Axial Aberration

被引：0
|
作者：
Sawada, Hidetaka [1 ,2 ,3 ]
Kirkland, Angus I. [1 ,2 ]
机构：
[1] Diamond Light Source Ltd, ePSIC, Oxford OX11 0DE, England
[2] Univ Oxford, Dept Mat, Parks Rd, Oxford OX1 3PH, England
[3] JEOL UK Ltd, Welwyn Garden City AL7 1LT, Herts, England
来源：
ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2017 (EMAG2017) | 2017年 / 902卷
关键词：
D O I：
10.1088/1742-6596/902/1/012011
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
High-resolution observation of a large field of view with a high quality detector is important for single particle analysis or in-situ experiments. Consequently, evaluation of aberrations that depend on position in the field of view, (off-axial aberrations) is required. We report the experimental measurement of off-axial aberrations including higher order components in several optical conditions together with the corresponding off-axial phase maps.
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页数：4
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