Aberration analysis calculations for synchrotron radiation beamline design

被引：1
|
作者：
McKinney, WR
Howells, M
Padmore, H
机构：
来源：
GRATINGS AND GRATING MONOCHROMATORS FOR SYNCHROTRON RADIATION | 1997年 / 3150卷
关键词：
beamline design; aberrations; ray tracing;
D O I：
10.1117/12.292731
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The application of ray deviation calculations based on aberration coefficients for a single optical surface for the design of beamline optical systems is reviewed. A systematic development is presented which allows insight into which aberration may be causing the rays to deviate from perfect focus. A new development allowing analytical calculation of lineshape is presented.
引用
收藏
页码：105 / 112
页数：8
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