Nondestructive forensic analysis of antique stamps by use of synchrotron radiation infrared spectromicroscopy.

被引：0
|
作者：
Wilkinson, TJ [1 ]
Perry, DL [1 ]
Martin, MC [1 ]
McKinney, WR [1 ]
机构：
[1] Lawrence Berkeley Lab, Berkeley, CA 94720 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2003年 / 225卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
158-IEC
引用
收藏
页码：U976 / U976
页数：1
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