Analysis of image retention in alternating-current thin-film electroluminescent devices

被引：1
|
作者：
Krasnov, AN [1 ]
Hofstra, PG [1 ]
Bajcar, RC [1 ]
机构：
[1] Luxell Technol Inc, Mississauga, ON L4W 2S5, Canada
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 1998年 / 17卷 / 19期
关键词：
D O I：
10.1023/A:1006679003632
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：1673 / 1675
页数：3
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