Time-Resolved Microphotoluminescence Study of Cu(In,Ga)Se2

被引:47
|
作者
Sakurai, Takeaki [1 ]
Taguchi, Keiki [1 ]
Islam, Muhammad Monirul [1 ]
Ishizuka, Shogo [2 ]
Yamada, Akimasa [2 ]
Matsubara, Koji [2 ]
Niki, Shigeru [2 ]
Akimoto, Katsuhiro [2 ]
机构
[1] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan
[2] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
关键词
THIN-FILM; GRAIN-BOUNDARIES; DEFECT STATES; DEPENDENCE; EFFICIENCY; PHASE;
D O I
10.1143/JJAP.50.05FC01
中图分类号
O59 [应用物理学];
学科分类号
摘要
The carrier recombination processes in Cu(In1-x,Ga-x)Se-2 (CIGS) thin films were investigated by time-resolved microscopic-photoluminescence (mu-PL) measurement at room temperature. For films with x = 45, the spatial distribution of the donor-acceptor pair luminescence is much larger than the grain size. The PL decay lifetime is directly correlated with the mu-PL intensity, but the spectral shape is identical regardless of the sample position. These results suggest that the nonuniform distribution of nonradiative recombination centers mainly affects the carrier recombination in CIGS thin films. At relatively high Ga concentrations (x >= 0.7), the spatial inhomogeneity in mu-PL intensity is enhanced and decay accelerated, suggesting an increase in the density of nonradiative recombination centers. Thus, suppression of nonradiative recombination is critical to enhancing the performance of CIGS-based solar cells. (C) 2011 The Japan Society of Applied Physics
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页数:5
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