Ptychographic characterization of a coherent nanofocused X-ray beam

被引：46

作者：

Bjorling, Alexander ^{[1
]}

Kalbfleisch, Sebastian ^{[1
]}

Kahnt, Maik ^{[1
]}

Sala, Simone ^{[1
]}

Parfeniukas, Karolis ^{[2
]}

Vogt, Ulrich ^{[2
]}

Carbone, Gerardina ^{[1
]}

Johansson, Ulf ^{[1
]}

机构：

[1] Lund Univ, Max IV Lab, S-22100 Lund, Sweden

[2] Albanova Univ Ctr, KTH Royal Inst Technol, Dept Appl Phys Biomed & Xray Phys, S-10691 Stockholm, Sweden

来源：

OPTICS EXPRESS | 2020年 / 28卷 / 04期

基金：

瑞典研究理事会;

关键词：

D O I：

10.1364/OE.386068

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The NanoMAX hard X-ray nanoprobe is the first beamline to take full advantage of the diffraction-limited storage ring at the MAX IV synchrotron and delivers a high coherent photon flux for applications in diffraction and imaging. Here, we characterize its coherent and focused beam using ptychographic analysis. We derive beam profiles in the energy range 6-22 keV and estimate the coherent flux based on a probe mode decomposition approach. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：5069 / 5076

页数：8

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