Exchange coupling in Fe50Mn50/Ni81Fe19 bilayer:: Dependence on antiferromagnetic layer thickness

被引：66
|
作者：
Sang, H [1 ]
Du, YW
Chien, CL
机构：
[1] Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA
[2] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[3] Nanjing Univ, Inst Solid State Phys, Nanjing 210093, Peoples R China
来源：
JOURNAL OF APPLIED PHYSICS | 1999年 / 85卷 / 08期
关键词：
D O I：
10.1063/1.369146
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have determined the dependence of exchange coupling on the antiferromagnetic layer thickness (t(AF)) in FeMn/NiFe bilayers, where the FeMn layer varies from 0.5 to 32 nm, and the NiFe is constant at 30 nm. For t(AF)>3 nm, the exchange field H-ex varies as (1/t(AF))(0.3) at both 80 and 300 K, whereas the coercivity is insensitive to t(AF). The value of H-ex displays a simple angular dependence of cos theta. (C) 1999 American Institute of Physics. [S0021-8979(99)39508-6].
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页码：4931 / 4933
页数：3
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