Magnetoresistance in thin films of silver chalcogenides

被引：0

作者：

Chuprakov, IS ^{[1
]}

Lyalikov, VB ^{[1
]}

Dahmen, KH ^{[1
]}

Xiong, P ^{[1
]}

机构：

[1] Florida State Univ, Dept Chem, Tallahassee, FL 32306 USA

来源：

MAGNETORESISTIVE OXIDES AND RELATED MATERIALS | 2001年 / 602卷

关键词：

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Oriented and non-oriented thin films of silver(l) telluride, Ag2Te, were prepared by e-beam evaporation, vapor transport technique and Chemical Vapor Deposition (CVD), Crystallinity and orientation of the films were studied by Theta -2 Theta XRD, rocking curve and pole figure measurements. The origin and conditions for the oriented growth are discussed. Special microdevice was prepared by photolitography from the oriented films of Ag2Te in order to investigate magnetoresistance (MR) in this material. It was proved that the reported earlier negative NIR in Ag2Te films is a completely geometrical effect, which can be observed using non-linear arrangement of current and voltage contacts.

引用

页码：47 / 52

页数：6

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