synthetic chart;
average run length;
(x)over-bar chart;
conforming run length chart;
D O I:
10.1081/SAC-100002369
中图分类号:
O21 [概率论与数理统计];
C8 [统计学];
学科分类号:
020208 ;
070103 ;
0714 ;
摘要:
The Synthetic control chart has recently been introduced as an improvement over the standard Shewhart control chart for detecting changes in the mean of a normally distributed process. The salient features of the Shewhart chart and the Conforming Run Length chart are integrated to produce the Synthetic control chart. In many practical instances, the Synthetic chart is superior to the Shewhart chart in terms of quicker detection of out-of-control status when the process data art: normally distributed. The robustness of the Synthetic chart to violations of the normality assumption is the central theme of this study. We find that in-control average run lengths for the Synthetic chart are reasonably close to the normal theory values when there is moderate nonnormality or when the sample size n is large. Additionally, out-of-control average run lengths are comparable to the corresponding normal theory values for a variety of non-normal distributions.
机构:
Univ Amsterdam IBIS UvA, Inst Business & Ind Stat, NL-1018 TV Amsterdam, NetherlandsUniv Amsterdam IBIS UvA, Inst Business & Ind Stat, NL-1018 TV Amsterdam, Netherlands
Schoonhoven, Marit
Does, Ronald J. M. M.
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机构:
Univ Amsterdam IBIS UvA, Inst Business & Ind Stat, NL-1018 TV Amsterdam, NetherlandsUniv Amsterdam IBIS UvA, Inst Business & Ind Stat, NL-1018 TV Amsterdam, Netherlands