Testing the Accuracy of the Calculation of Gold Leaf Thickness by MC Simulations and MA-XRF Scanning

被引:16
|
作者
Lins, Sergio Augusto Barcellos [1 ,2 ]
Gigante, Giovanni Ettore [1 ]
Cesareo, Roberto [3 ]
Ridolfi, Stefano [4 ]
Brunetti, Antonio [5 ]
机构
[1] Univ Roma La Sapienza, Dipartimento Sci Base & Applicate Ingn, Via Antonio Scarpa 14-16, I-00161 Rome, Italy
[2] INFN Roma Tre, Surface Anal Lab, Via Vasca Navale 84, I-00146 Rome, Italy
[3] Univ Sassari, Ist Matemat & Fis, I-07100 Sassari, Italy
[4] Ars Mensurae, Via Vincenzo Comparini 101, I-00188 Rome, Italy
[5] Univ Sassari, Dipartimento Chim & Farm, Via Vienna 2, I-07100 Sassari, Italy
来源
APPLIED SCIENCES-BASEL | 2020年 / 10卷 / 10期
关键词
MA-XRF; Monte Carlo simulations; thickness calculation; differential attenuation; X-RAY-FLUORESCENCE; K-ALPHA/K-BETA; EDXRF-ANALYSIS; OBJECTS;
D O I
10.3390/app10103582
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Featured Application Characterization of surfaces in multilayered structures is a requirement in many application areas. Such characterization should be nondestructive, and, in some cases, it must be performed in situ. This is the case of precious Cultural Heritage samples. The use of X-ray fluorescence analysis is currently one of the few solutions. When a large surface must be characterized, a MA-XRF scanning system can also be employed. Abstract The use of X-ray fluorescence (XRF) scanning systems has become a common practice in many application sectors. In multistratified and heterogeneous samples, the simple analysis of an XRF spectrum as a response of the entire sample is not reliable, so different spectral analysis techniques have been proposed to detect the presence of surface stratification. One commonly studied case is that of gilding, i.e., the presence of a superimposing gold-leaf layer. The observation of changes in the net peak ratios of a single element or of several elements in an XRF spectrum is a well-developed practice, but is still not used in the case of XRF scanning (macro-X-Ray fluorescence scanning, MA-XRF), a technique that can be described as the extrapolation of XRF spot analysis to a second dimension, scanning a sample surface instead. This practice can yield information on the overlaying layer thickness, if some properties of the sample are known-or estimated-beforehand, e.g., the overlapping layer's chemical composition and the matrix effect contribution from the bulk material (thick ratio). This work proposes the use of an algorithm to calculate the thickness distribution of a superimposing gold layer accurately and automatically through the differential attenuation method by using MA-XRF datasets in a total noninvasive manner. This approach has the clear advantage over the traditional spot sampling of allowing the generation of a surface heightmap to better visualize and interpret the data, as well as a considerably larger sample space. Monte Carlo simulations were used to verify the influence of the medium used to adhere the gold leaves to the substrate and to generate known spectra to assess the algorithm's accuracy.
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页数:12
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