A portable residual stresses measurement device using ESPI and a radial in-plane interferometer

被引:0
|
作者
Albertazzi, A [1 ]
Kanda, C [1 ]
Borges, MR [1 ]
Hrebabetzky, F [1 ]
机构
[1] Univ Fed Santa Catarina, BR-88040970 Florianopolis, SC, Brazil
关键词
ESPI; residual stresses; interferometry; radial interferometer; blind hole drilling;
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper presents a new kind of double illumination interferometer used for radial in-plane displacement measurement through electronic speckle pattern interferometry (ESPI). Some characteristics and implementation details are discussed. This new interferometer is used for residual stresses measurement combining, in a very efficient way, the blind hole method and the in-plane radial displacement measurement by ESPI. Algorithms and implementation characteristics are also discussed. A portable device was built to measure residual stress outside the optical bench. Early results show a measurement performance comparable to the conventional blind hole method using strain gages. Measurement time is almost one order less than the strain gage based measurement system.
引用
收藏
页码:112 / 122
页数:11
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