Genetic Algorithm for Self-Test Path and Circular Self-Test Path Design

The article presents the use of Genetic Algorithm to search for non-linear Autonomous Test Structures (ATS) in Built-In Testing approach. Such structures can include essentially STP and CSTP and their modifications. Nonlinear structures are more difficult to analyze than the widely used structures like independent Test Pattern Generator and the Test Response Compactor realized by Linear Feedback Shift Register. To reduce time-consuming test simulation of sequential circuit it was used an approach based on the stochastic model of pseudo-random testing. The use of stochastic model significantly affects the time effectiveness of the search for evolutionary autonomous structures. In test simulation procedure the block of sequential circuit memory is not disconnected. This approach does not require a special selection of memory registers like BILBOs. A series of studies to test circuits set ISCAS'89 are made. The results of the study are very promising.