Automated High-Throughput Patch Clamp and Modelling to Capture hERG Kinetics and Temperature Dependence using Optimised Voltage Protocols

被引:0
|
作者
Lei, Chon Lok [1 ]
Clerx, Michael [1 ]
Gavaghan, David J. [1 ]
Stiehler, Johannes [2 ]
Polonchuk, Liudmila [3 ]
Wang, Ken [3 ]
Mirams, Gary R. [4 ]
机构
[1] Univ Oxford, Dept Comp Sci, Oxford, England
[2] Nanion Technol GmbH, Munich, Germany
[3] F Hoffmann La Roche Ltd, Roche Pharmaceut Res & Early Dev, Basel, Switzerland
[4] Univ Nottingham, Ctr Math Med & Biol, Nottingham, England
关键词
D O I
暂无
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
2788-Pos
引用
收藏
页码:570A / 570A
页数:1
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