Determination of the Residual Stress Field around Scratches using Synchrotron X-rays and Nanoindentation

被引：0
|
作者：
Khan, M. K. [1 ]
Fitzpatrick, M. E. [1 ]
Edwrads, L. E. [1 ,2 ]
Hainsworth, S. V.
机构：
[1] Open Univ, Dept Mat Engn, Milton Keynes MK7 6AA, Bucks, England
[2] Australian Nucl Sci & Technol Org, Menai, NSW 2234, Australia
来源：
MECHANICAL STRESS EVALUATION BY NEUTRONS AND SYNCHROTRON RADIATION | 2010年 / 652卷
关键词：
Scratches; Residual stress; Synchrotron X-rays; Root radius; Nanoindentation; FOREIGN-OBJECT DAMAGE; HIGH-CYCLE FATIGUE; TI-6AL-4V;
D O I：
10.4028/www.scientific.net/MSF.652.25
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The residual strain field around the scratches of 125 mu m depth and 5 mu m root radius have been measured from the Synchrotron X-ray diffraction. Scratches were produced using different tools in fine-grained aluminium alloy AA 5091. Residual stresses up to +1700 micro-strains were measured at the scratch tip for one tool but remained up to only +1000 micro-strains for the other tool scratch. The load-displacement curves obtained from nanoindentation were used to determine the residual stresses around the scratches. It was found that the load-displacement curves are sensitive to any local residual stress field present and behave according to the type of residual stresses. This combination of nanoindentation and synchrotron X-rays has been proved highly effective for the study of small-scale residual stresses around the features such as scratches.
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页码：25 / +
页数：2
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