Near-field to Far-field Transformation with Non-contacting Near-field Measurement by Using Kirchhoff Surface Integral Representation

被引：0

作者：

Lai, Li-Wen ^{[1
]}

Liu, Jia-Yu ^{[1
]}

Wu, Yu-Yung ^{[1
]}

Wu, Sung-Mao ^{[1
]}

Fu, Ming-Chang ^{[2
]}

机构：

[1] Natl Univ Kaohsiung, Dept Elect Engn, Micro Elect Packaging Lab, Kaohsiung, Taiwan

[2] SmartNet Global Ltd, Taipei, Taiwan

来源：

2015 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC), VOLS 1-3 | 2015年

关键词：

Tertns near-field to far-field transformation; Kirchhoff surface integral representation; patch antenna; non-contacting measurement; EM-ISIGHT;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The research majored in the implementation of non-contacting near-field to far-field transformation. The emphasized methodology of transformation was according to the Kirchhoff surface integral representation (KSIR) having one of most outstanding advantages is that it could distinguish the six field independently on the basis of their each individual integral surface and simplify the complexity of formula calculation simultaneously. A patch antenna chosen to be the device under test was fabricated on the height 0.9mm of the FR4 for assisting the near-field to far-field transformation and operated at center frequency 2.4GHz. Moreover, the research attached importance to the non-contacting measurement device EM-ISIGHT of APREL Inc. utilized to measure the near-field radiation of the patch antenna. Combining the near-field data and the KSIR to extract the far-field radiation of the DUT was the principal transformation methodology.

引用

页数：3

共 50 条

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