Aqueous solution deposition of amorphous gallium tin oxide for thin-film transistors applications

被引:10
|
作者
Zhang, Lingjiao [1 ]
Zhu, Deliang [1 ]
Han, Shun [1 ]
Lu, Youming [1 ]
Fang, Ming [1 ]
Liu, Wenjun [1 ]
Cao, Peijiang [1 ]
Xu, Wangying [1 ]
机构
[1] Shenzhen Univ, Coll Mat Sci & Engn, Guangdong Res Ctr Interfacial Engn Funct Mat, Shenzhen Key Lab Special Funct Mat, Shenzhen 518060, Peoples R China
基金
中国国家自然科学基金;
关键词
Gallium tin oxide; Aqueous solution deposition; Amorphous oxide semiconductors; Thin-film transistors; Oxygen vacancies; OPTICAL-PROPERTIES; GA2O3; FILMS; TEMPERATURE; PERFORMANCE; SEMICONDUCTORS; FABRICATION; VOLTAGE; STATES;
D O I
10.1016/j.ceramint.2020.05.010
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Amorphous gallium fin oxide (GTO) thin films were prepared by a facile, and eco-friendly, aqueous solution process and their applications in thin-film transistors (TFTs) were investigated. The success of the aqueous route was realized by introducing fin fluoride (SnF2) instead of the traditional fin chloride (SnCl2) solute. The roles of adding Ga on the GTO's microstructural, optical, chemical, and electrical performance were comprehensively studied. It was found that Ga can frustrate the crystallization while it augments the optical bandgap (E-g) value of pristine SnO2. More importantly, using Ga could effectively inhibit the formation of oxygen vacancies, thus greatly improving the electrical performance of the GTO TFTs. The amorphous GTO TFTs with a Ga content of 45% exhibited optimum performance, with a saturation mobility (mu(sat)) of 4.26 cm(2)/V s, an on/off current ratio (I-on/I-off ) > 10(7) , and a decent bias stress durability.
引用
收藏
页码:19557 / 19563
页数:7
相关论文
共 50 条
  • [1] Solution processed amorphous gallium-incorporated tin oxide thin-film transistors
    Hu, Gengtao
    Yang, Jianwen
    Han, Yanbing
    Cao, Duo
    Liu, Feng
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2020, 59 (05)
  • [2] Aqueous Solution Derived Amorphous Indium Doped Gallium Oxide Thin-Film Transistors
    He, Fuchao
    Qin, Yu
    Wang, Yifei
    Lin, Zhenhua
    Su, Jie
    Zhang, Jincheng
    Chang, Jingjing
    Hao, Yue
    [J]. IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2021, 9 : 373 - 377
  • [3] Amorphous Tin Oxide Applied to Solution Processed Thin-Film Transistors
    Avis, Christophe
    Kim, YounGoo
    Jang, Jin
    [J]. MATERIALS, 2019, 12 (20)
  • [4] Light Effect on Amorphous Tin Oxide Thin-Film Transistors
    Avis, Christophe
    Billah, Mohammad Masum
    Jang, Jin
    [J]. ADVANCED PHOTONICS RESEARCH, 2024, 5 (04):
  • [5] Solution-Processed Gallium-Tin-Based Oxide Semiconductors for Thin-Film Transistors
    Zhang, Xue
    Lee, Hyeonju
    Kim, Jungwon
    Kim, Eui-Jik
    Park, Jaehoon
    [J]. MATERIALS, 2018, 11 (01):
  • [6] Thin-film transistors with amorphous indium gallium oxide channel layers
    Chiang, H. Q.
    Hong, D.
    Hung, C. M.
    Presley, R. E.
    Wager, John F.
    Park, C. -H
    Keszler, D. A.
    Herman, G. S.
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2006, 24 (06): : 2702 - 2705
  • [7] Hydrogen incorporation into amorphous indium gallium zinc oxide thin-film transistors
    Mattson, George W.
    Vogt, Kyle T.
    Wager, John F.
    Graham, Matt W.
    [J]. JOURNAL OF APPLIED PHYSICS, 2022, 131 (10)
  • [8] Thin-Film Transistors With Amorphous Indium-Gallium-Oxide Bilayer Channel
    Yang, C. P.
    Chang, S. J.
    Chang, T. H.
    Wei, C. Y.
    Juan, Y. M.
    Chiu, C. J.
    Weng, W. Y.
    [J]. IEEE ELECTRON DEVICE LETTERS, 2017, 38 (05) : 572 - 575
  • [9] Tin oxide transparent thin-film transistors
    Presley, RE
    Munsee, CL
    Park, CH
    Hong, D
    Wager, JF
    Keszler, DA
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2004, 37 (20) : 2810 - 2813
  • [10] Amorphous Indium Tin Oxide Thin-Film Transistors Fabricated by Cosputtering Technique
    Xu, Xin
    Zhang, Letao
    Shao, Yang
    Chen, Zheyuan
    Le, Yong
    Zhang, Shengdong
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (03) : 1072 - 1077